DocumentCode :
1034880
Title :
In situ electric probe method for determining the dielectric properties of materials
Author :
Misra, Devendra K.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Wisconsin Univ., Milwaukee, WI, USA
Volume :
37
Issue :
1
fYear :
1988
fDate :
3/1/1988 12:00:00 AM
Firstpage :
157
Lastpage :
160
Abstract :
An attempt is made to use the induced-EMF (electromagnetic field) method for input impedance determination of an antenna in order to compute the dielectric behavior of the medium over a large range of probe lengths. Numerical results obtained by this approach are compared with those of other existing theories valid for different probe lengths as well as with available experimental data. A fairly close agreement is found among these results
Keywords :
antennas; dielectric measurement; numerical methods; probes; antenna; coaxial line; dielectric properties of materials; in situ electric probe; induced-EMF; input impedance; numerical methods; Circuits; Dielectric materials; Dielectric measurements; Flip-flops; Impedance; Length measurement; Probes; Pulse amplifiers; Statistical analysis; Transmitters;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.2690
Filename :
2690
Link To Document :
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