DocumentCode :
1035294
Title :
A new machine learning paradigm for terrain reconstruction
Author :
Yeu, Chee-Wee Thomas ; Lim, Meng-Hiot ; Huang, Guang-Bin ; Agarwal, Amit ; Ong, Yew-Soon
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore
Volume :
3
Issue :
3
fYear :
2006
fDate :
7/1/2006 12:00:00 AM
Firstpage :
382
Lastpage :
386
Abstract :
Terrain models that permit multiresolution access are essential for model predictive control of unmanned aerial vehicles in low-level flights. The authors present the extreme learning machine (ELM), a recently proposed learning paradigm, as a mechanism for learning the stored digital elevation information to allow multiresolution access. We give results of simulations designed to compare the performance of our approach with two other approaches for multiresolution access, namely: 1) linear interpolation on Delaunay triangles of the sampled terrain data points and 2) terrain learning using support vector machines (SVMs). The results show that to achieve the same mean square error during access, the memory needed in our approach is significantly lower. Additionally, the offline training time for the ELM network is much less than that for the SVM
Keywords :
geophysics computing; learning (artificial intelligence); mesh generation; radial basis function networks; support vector machines; terrain mapping; topography (Earth); Delaunay triangulation; digital elevation information; extreme learning machine; low-level flights; multiresolution access; radial basis function network; support vector machine; terrain mapping; terrain reconstruction; unmanned aerial vehicles; Data structures; Delay; Interpolation; Machine learning; Mean square error methods; Neural networks; Predictive models; Robot sensing systems; Support vector machines; Unmanned aerial vehicles; Delaunay triangulation; extreme learning machine; radial basis function (RBF) networks; support vector machine (SVM); terrain mapping;
fLanguage :
English
Journal_Title :
Geoscience and Remote Sensing Letters, IEEE
Publisher :
ieee
ISSN :
1545-598X
Type :
jour
DOI :
10.1109/LGRS.2006.873687
Filename :
1658010
Link To Document :
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