DocumentCode :
1035295
Title :
Avalanche degradation of h
FE
Author :
McDonald, Brent
Volume :
16
Issue :
2
fYear :
1969
fDate :
2/1/1969 12:00:00 AM
Firstpage :
244
Lastpage :
245
Keywords :
Current density; Degradation; Displays; Doping profiles; Driver circuits; Image reconstruction; Iron; Layout; Optical pulses; Solid state circuits;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1969.16660
Filename :
1475702
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1035295
