• DocumentCode
    1035510
  • Title

    Ferrite device characteristics and coincident current store performance

  • Author

    Gogos, Bela ; Zagursky, Joseph J.

  • Author_Institution
    IBM Corporation, Poughkeepsie, N.Y.
  • Volume
    3
  • Issue
    3
  • fYear
    1967
  • fDate
    9/1/1967 12:00:00 AM
  • Firstpage
    307
  • Lastpage
    310
  • Abstract
    A shmoo plot or failure boundary curve for a coincident current store is a region defining the limits of drive current, both address and bit, within which the system can operate satisfactorily. Because of the nonlinear characteristics of the ferrite core, the sense circuitry, and many aspects of the drive system, the exact mathematical expression of a shmoo curve would be quite involved, and therefore is treated empirically. The effect on storage operation of nonuniformity in device properties, such as squareness and threshold, is explored. Based on distributions of certain device properties which can be related to the output parameters of a core measured under conventionally accepted 3D test conditions, constant shmoo curves are derived.
  • Keywords
    Ferrite core memories; Circuits; Current measurement; Fabrication; Ferrite devices; Frequency measurement; Noise cancellation; Noise shaping; Pulse measurements; Shape; Testing;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1967.1066073
  • Filename
    1066073