New analysis for the assignment of UV-visible ionic Xe laser lines

Author

Duchowicz, Ricardo ; Schinca, Daniel ; Gallardo, Mario

Author_Institution

Centro de Investigaciones Opticas, La Plata, Argentina

Volume

30

Issue

1

fYear

1994

fDate

1/1/1994 12:00:00 AM

Firstpage

155

Lastpage

159

Abstract

Visible and UV laser emissions from a highly ionized pulsed Xe plasma were studied in relation to the ionic assignment of the laser lines. Time-resolved spectroscopy and intensity versus pressure analysis were used to determine the ionic origin of the studied lines. The results of both methods show good agreement, and the joint coincidence is used as a criterion for ionic classification, thus imposing a stringent condition for the assignment of the lines and enhancing its reliability. The disagreement between some of our assignments and those from other authors are discussed on the basis of the results of our systematic analysis of more than 200 spontaneous lines in the region of interest

Keywords

ion lasers; laser transitions; plasma diagnostics; time resolved spectra; xenon; 230 to 600 nm; 4954.13 A; UV laser emissions; UV-visible ionic Xe laser line assignment; Xe; highly ionized pulsed Xe plasma; intensity; ionic assignment; pressure analysis; reliability; spontaneous lines; time-resolved spectroscopy; visible laser emissions; Energy states; Fault location; Infrared spectra; Laser transitions; Optical pulses; Plasma density; Plasma waves; Plasma x-ray sources; Spectroscopy; Spontaneous emission;

fLanguage

English

Journal_Title

Quantum Electronics, IEEE Journal of

Publisher

ieee

ISSN

0018-9197

Type

jour

DOI

10.1109/3.272074

Filename

272074