Title :
Design and AC characteristics of silicon MOS hall elements
Author :
Gallagher, R. ; Corak, W.
Author_Institution :
Westinghouse Electric Corporation, Baltimore, Md
fDate :
9/1/1967 12:00:00 AM
Keywords :
Hall effect devices; Semiconductor devices; Circuits; Electrons; Fabrication; Hall effect; MOSFETs; Radiative recombination; Resistors; Silicon; Spontaneous emission; Threshold voltage;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1967.1066081