Title :
Bulk oscillation by tunnel injection
Author :
Okabe, Toshiya ; Nishizawa, J. ; Takamiya, S.
fDate :
2/1/1969 12:00:00 AM
Keywords :
Electrodes; Frequency; Gallium arsenide; Lifetime estimation; Monitoring; Noise figure; P-n junctions; Pulse measurements; Semiconductor diodes; Tunneling;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1969.16695
