Title :
The biplanar thyristor: A method for combining reliability and low costs
Author :
Kauffman, W. ; Albus, H.P.
fDate :
2/1/1969 12:00:00 AM
Keywords :
Costs; Delay; Frequency conversion; Frequency measurement; Loss measurement; Mixers; Scattering; Temperature measurement; Thyristors; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1969.16698