DocumentCode :
1035663
Title :
High-temperature superconducting shift registers operating at up to 100 GHz
Author :
Martens, Jon S. ; Pance, Aleksandar ; Char, Kookrin ; Johansson, Marie E. ; Whiteley, Stephen R. ; Wendt, Joel R. ; Hietala, Vincent M. ; Plut, Tom A. ; Ashby, Carol I.H. ; Hou, Shang Y. ; Phillips, Julia M.
Author_Institution :
Conductus Inc., Sunnyvale, CA, USA
Volume :
29
Issue :
1
fYear :
1994
fDate :
1/1/1994 12:00:00 AM
Firstpage :
56
Lastpage :
62
Abstract :
Shift registers have been demonstrated in YBaCuO operating at 77 K using from 64 to over 1000 junctions. These are some of the larger scale integrated circuits demonstrated to date using YBaCuO Josephson technology. The circuit is a modified rapid single flux quantum design in which a single trigger pulse causes a one bit shift of the entire word of 32-512 b in length. Two different junction technologies, electron-beam defined nanobridges and epitaxial edge junctions, have been used with parameter spreads ranging from 11% to 22%. Correct operation has been verified with low speed random word tests and circulating data tests while pseudo random bit sequence demonstrations are underway. A practical amount of time to shift between cells has been measured to be about 10 ps
Keywords :
barium compounds; high-temperature superconductors; logic testing; nanotechnology; shift registers; superconducting logic circuits; yttrium compounds; 10 ps; 100 GHz; 32 to 512 bit; 77 K; YBaCuO; YBaCuO Josephson technology; cell shift time; circulating data tests; electron-beam defined nanobridges; epitaxial edge junctions; high-temperature superconductor; large scale integrated circuits; low speed random word tests; pseudo random bit sequence demonstrations; rapid single flux quantum design; shift registers; single trigger pulse; High temperature superconductors; Integrated circuit technology; Josephson junctions; Pulse circuits; Shift registers; Superconducting epitaxial layers; Superconducting integrated circuits; Testing; Time measurement; Yttrium barium copper oxide;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.272094
Filename :
272094
Link To Document :
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