Title :
VHF noise due to surface states in MOS devices
fDate :
2/1/1969 12:00:00 AM
Keywords :
Absorption; Costs; FETs; Fuel cells; MOS devices; MOSFET circuits; Paramagnetic materials; Power generation economics; Semiconductor device noise; Thermal resistance;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1969.16729
