DocumentCode
1035939
Title
VHF noise due to surface states in MOS devices
Author
Jones, Bryn Ll
Volume
16
Issue
2
fYear
1969
fDate
2/1/1969 12:00:00 AM
Firstpage
258
Lastpage
259
Keywords
Absorption; Costs; FETs; Fuel cells; MOS devices; MOSFET circuits; Paramagnetic materials; Power generation economics; Semiconductor device noise; Thermal resistance;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1969.16729
Filename
1475771
Link To Document