Title :
High-frequency overtone TCXO based on mixing of dual crystal oscillators
Author :
Huang, Xianhe ; Wei, Wei ; Tan, Feng ; Fu, Wei
Author_Institution :
Univ. of Electron. Sci. & Technol. of China, Chengdu
fDate :
6/1/2007 12:00:00 AM
Abstract :
To implement a high-stability and high-frequency overtone temperature-compensated crystal oscillator (TCXO) conveniently, an improved design of the novel overtone TCXO is described in this paper. A 120-MHz TCXO based on mixing of dual crystal oscillators is implemented. It utilizes a 100-MHz AT-cut 5th-overtone crystal oscillator mixed with a 20-MHz AT-cut voltage-controlled crystal oscillator (VCXO). The 120-MHz mixed product is filtered to produce the output signal. The total frequency deviation of 20-MHz and 100-MHz crystal oscillators is compensated by adjusting the output frequency of the 20-MHz oscillator to produce the stable 120-MHz output frequency. In this work, verifying experimental results of the compensation are presented. The stability of the experimental 120-MHz overtone TCXO with microprocessor temperature compensation achieves plusmn2 times 10-7 over the temperature range from -30degC to +70degC. A phase noise level of -133 dBc/Hz at 1 kHz offset has been initially measured for the prototype TCXO. The experimental result demonstrates this approach can conveniently implement the high-frequency overtone temperature compensation with a relatively high stability, and it is available for a wider frequency range as well.
Keywords :
VHF oscillators; crystal oscillators; phase noise; voltage-controlled oscillators; -30 to 70 degC; 1 kHz; 100 MHz; 120 MHz; 20 MHz; 5th-overtone crystal oscillator; dual crystal oscillators; high-frequency overtone TCXO; phase noise; temperature-compensated crystal oscillator; voltage-controlled crystal oscillator; Circuits; Frequency conversion; Frequency synthesizers; Microprocessors; Oscillators; Phase noise; Resonant frequency; Stability; Temperature distribution; Temperature sensors; Electronics; Equipment Design; Equipment Failure Analysis; Oscillometry; Reproducibility of Results; Sensitivity and Specificity; Time Factors;
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
DOI :
10.1109/TUFFC.2007.364