Title :
Cutoff frequency of punch-through diodes
fDate :
3/1/1969 12:00:00 AM
Abstract :
The cutoff frequency of punch-through diodes has been derived in a form which includes the dependence of bias voltage and extrinsic series resistance. The conditions for high cutoff frequency are described. Lower cutoff frequencies are predicted for thin epitaxial diodes.
Keywords :
Capacitance; Conductivity; Contact resistance; Cutoff frequency; Dielectrics; Epitaxial layers; Equations; Schottky diodes; Semiconductor process modeling; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1969.16747
