Title :
Improved two-port magnetoelastic delay line efficiency through controlled polarization reversals
Author :
Skudera, W., Jr.
Author_Institution :
U.S. Army Electronics Command, Fort Monmouth, NJ
fDate :
9/1/1967 12:00:00 AM
Keywords :
Delay lines; Magnetoelastic devices; YAG; YIG; Bandwidth; Bonding; Delay lines; Frequency; Insertion loss; Magnetic confinement; Magnetic fields; Optical losses; Permanent magnets; Polarization;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1967.1066132