Title :
Effect of failure kinetics on time-to-failure distributions
Author :
Stewart, Robert G.
Author_Institution :
Lockheed Palo Alto Research Laboratory, Palo Alto, Calif.
fDate :
4/1/1969 12:00:00 AM
Abstract :
The kinetics or time dependence of a device quantity has an explicit effect on the time-to-failure distribution resulting from a given distribution of device degradation coeffecients. In particular, for nth power kinetics, the larger the value of n, the smaller the deviation from the mean.
Keywords :
Degradation; Equations; Failure analysis; Kinetic theory; Mechanical factors; Physics; Stress;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1969.16764
