Title :
Electromigration in thin gold films
Author :
Hartman, Thomas E. ; Blair, James C.
Author_Institution :
Texas Instruments Inc., Dallas, Tex.
fDate :
4/1/1969 12:00:00 AM
Abstract :
Electromigration in gold film conductors results in regions of material accumulation and depletion. These regions arise from and are correlated with the thermal gradients along the conductor. This result is in contrast with the observations on aluminum conductors where the effect is dominated by the structure or metallurgical properties of the film.
Keywords :
Aluminum; Anodes; Conducting materials; Conductive films; Electromigration; Electrons; Electrostatics; Gold; Temperature; Transistors;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1969.16766
