Title :
Characterising the UHF factory radio channel
Author :
Rappaport, T.S. ; McGillem, C.D.
Author_Institution :
Purdue University, Engineering Research Centre for Intelligent Manufacturing Systems, West Lafayette, USA
Abstract :
Portable UHF factory multipath measurement apparatus is being used to measure multipath delay profiles and narrowband fading at five large manufacturing sites in the mid-western US. Preliminary data indicate that typical RMS delay spreads range from 100 to 250 ns and that average CW path loss varies as distance to the power 2-2. This work is the first report of extensive multipath measurements in factory environments.
Keywords :
factory automation; fading; mobile radio systems; radiowave propagation; 100 to 250 ns; CW path loss; RMS delay spreads; UHF factory radio channel; extensive multipath measurements; factory environments; large manufacturing sites; multipath measurement apparatus; narrowband fading;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19870712
