Title :
High-sensitivity sampling technique for luminescence time constant measurement
Author :
Loualiche, S. ; Pauty, E.
Author_Institution :
CNET Lannion B, Lannion, France
Abstract :
A sampling method using fast photodetector diodes has been used for the first time to measure weak photoluminescence signals from AlxGa1¿xAs (x = 0.38) layers and GaAs/ AlGaAs (x = 0.33, 10 A°10 A°) superlattices. The method has a very high sensitivity of at least 20 photons/pulse and time resolution is limited only by the photodetector speed.
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; photoluminescence; photometry; semiconductor superlattices; AlxGa1-xAs layers; GaAs-AlGaAs superlattices; fast photodetector diodes; luminescence time constant measurement; sampling method; semiconductors; sensitivity 20 photons/pulse; time resolution; weak photoluminescence signals;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19870713
