DocumentCode
1036631
Title
Lifetime Measurements on a High-Reliability RF-MEMS Contact Switch
Author
Newman, Harvey S. ; Ebel, John L. ; Judy, Daniel ; Maciel, John
Author_Institution
Naval Res. Lab., Washington
Volume
18
Issue
2
fYear
2008
Firstpage
100
Lastpage
102
Abstract
Radio frequency microelectromechanical systems (RF MEMS) cantilever contact switches have been tested for lifetime. The mean cycles-to-failure measured on an ensemble of switches was 430 billion switch cycles. The longest lifetime exhibited without degradation of the switch was 914 billion switch cycles. The devices were switched at 20 kHz with an incident RF frequency of 10 GHz and an incident RF power of 20 dBm. Testing was performed continuously over a period of approximately 18 months. The switches were operated in a cold-switched mode.
Keywords
cantilevers; life testing; microswitches; reliability; cold-switched mode; frequency 10 GHz; frequency 20 kHz; high-reliability RF-MEMS cantilever contact switch; lifetime measurements; lifetime testing; radio frequency microelectromechanical system; Microelectromechanical systems (MEMS) devices; reliability testing; switches;
fLanguage
English
Journal_Title
Microwave and Wireless Components Letters, IEEE
Publisher
ieee
ISSN
1531-1309
Type
jour
DOI
10.1109/LMWC.2007.915037
Filename
4432289
Link To Document