• DocumentCode
    1036631
  • Title

    Lifetime Measurements on a High-Reliability RF-MEMS Contact Switch

  • Author

    Newman, Harvey S. ; Ebel, John L. ; Judy, Daniel ; Maciel, John

  • Author_Institution
    Naval Res. Lab., Washington
  • Volume
    18
  • Issue
    2
  • fYear
    2008
  • Firstpage
    100
  • Lastpage
    102
  • Abstract
    Radio frequency microelectromechanical systems (RF MEMS) cantilever contact switches have been tested for lifetime. The mean cycles-to-failure measured on an ensemble of switches was 430 billion switch cycles. The longest lifetime exhibited without degradation of the switch was 914 billion switch cycles. The devices were switched at 20 kHz with an incident RF frequency of 10 GHz and an incident RF power of 20 dBm. Testing was performed continuously over a period of approximately 18 months. The switches were operated in a cold-switched mode.
  • Keywords
    cantilevers; life testing; microswitches; reliability; cold-switched mode; frequency 10 GHz; frequency 20 kHz; high-reliability RF-MEMS cantilever contact switch; lifetime measurements; lifetime testing; radio frequency microelectromechanical system; Microelectromechanical systems (MEMS) devices; reliability testing; switches;
  • fLanguage
    English
  • Journal_Title
    Microwave and Wireless Components Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1531-1309
  • Type

    jour

  • DOI
    10.1109/LMWC.2007.915037
  • Filename
    4432289