Title :
Noncontacting Thickness Gauge Using Beta Rays
Author :
Clapp, C.W. ; Bernstein, S.
Author_Institution :
General Electric Company, Schenectady, N. Y.
Keywords :
Aluminum; Atmospheric measurements; Beta rays; Electron emission; Energy measurement; Ionization chambers; Radioactive materials; Sheet materials; Thickness measurement; Voltage;
Journal_Title :
American Institute of Electrical Engineers, Transactions of the
DOI :
10.1109/T-AIEE.1950.5060175
