Title :
Partitioning for pseudo-exhaustive testing is NP-complete
Author :
Song, Wanjuan ; Smith, K.C. ; Snelgrove, W.M.
Author_Institution :
University of Toronto, Department of Electrical Engineering, Toronto, Canada
Abstract :
In the letter, two schemes of circuit partitioning for pseudo-exhaustive testing are described. The complexities of both are proved to be NP-complete.
Keywords :
VLSI; computational complexity; decidability; integrated circuit testing; logic testing; NP completeness; PI partitioning; VLSI circuit testing; circuit partitioning; complexities; gate partitioning; logic testing; pseudoexhaustive testing;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19870741
