• DocumentCode
    1036698
  • Title

    Review of thin-film switching

  • Author

    Hagedorn, Fred B.

  • Author_Institution
    Bell Telephone Laboratories, Inc., Murray Hill, NJ, USA
  • Volume
    4
  • Issue
    1
  • fYear
    1968
  • fDate
    3/1/1968 12:00:00 AM
  • Firstpage
    41
  • Lastpage
    44
  • Abstract
    Flux reversal in thin magnetic films with uniaxial anisotropy is known to occur by domain wall motion if the externally applied field is only slightly above the wall motion threshold field. For sufficiently large fields applied at an angle with respect to the easy axis, reversal takes place by coherent rotation. However, the reversal process observed over a substantial field range immediately above the rotational threshold is neither simple wall motion nor simple coherent rotation. Four different models are reviewed which have been proposed for this third type of flux reversal process. These models were developed by Stein, Harte, Vinogradov, and Fuchikami, and it is concluded that no single model offers a complete description of this third process.
  • Keywords
    Magnetic film switching; Magnetization reversal; Anisotropic magnetoresistance; Magnetic domain walls; Magnetic field measurement; Magnetic fields; Magnetic films; Magnetic flux; Magnetization; Telephony; Torque; Transistors;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1968.1066185
  • Filename
    1066185