Title :
Electromagnetic environment analysis of a software park near transmission lines
Author :
He, Jinliang ; Chen, Shuiming ; Guo, Jian ; Zeng, Rong ; Lee, Jaebok ; Chang, Sughun ; Zhang, Bo ; Zou, Jun ; Guan, Zhicheng
Author_Institution :
Dept. of Electr. Eng., Tsinghua Univ., Beijing, China
Abstract :
The electromagnetic environments (EMEs) of the planned Zhongguancun Software Park near transmission lines, including electrical field, magnetic field, and ground potential rise under three cases of lightning stroke, normal operation, and short-circuit faults, are assessed by numerical analysis. The power frequency EMEs of the software park are below the maximum ecological allowed exposure values for the general public; , nevertheless, the power frequency magnetic field may interfere with the sensitive computer display unit. The influence of short-circuit fault in two different cases of remote short circuit and neighboring short circuit on the software park is discussed. The main problem we must pay attention to is the ground potential rise in the software park due to neighboring short-circuit fault; it would threaten the safe operation of electronic devices in the software park. On the other hand, the lightning stroke is a serious threat to the software park. How to improve the EMEs of the software park is discussed.
Keywords :
electric fields; electromagnetic fields; magnetic fields; power transmission faults; power transmission lines; short-circuit currents; electric field; electromagnetic environment; ground potential rise; lightning; magnetic field; shot-circuit faults; software park; transmission lines; Circuit faults; Electromagnetic analysis; Electromagnetic fields; Frequency; Lightning; Magnetic analysis; Magnetic fields; Power transmission lines; Software safety; Transmission lines; EME; Electromagnetic environment; electromagnetic field; ground potential rise; lightning; pulse magnetic field; short circuit; software park; transmission line;
Journal_Title :
Industry Applications, IEEE Transactions on
DOI :
10.1109/TIA.2004.830772