DocumentCode
1036841
Title
The effect of collector resistance upon the high current capability of n-p-ν-n transistors
Author
Hahn, Larry A.
Author_Institution
Texas Instruments Incorporated, Dallas, Tex.
Volume
16
Issue
7
fYear
1969
fDate
7/1/1969 12:00:00 AM
Firstpage
654
Lastpage
656
Abstract
It is shown that the onset of conductivity modulation of the bulk collector resistance causes an abrupt decrease in hFE at high current density and consequently limits the current range in which a transistor exhibits usable gain. Data are presented which demonstrate the accurate measurement of equilibrium collector resistance from a curve-tracer display. Experimental results showing the effect of partial saturation upon transistor switching time are also presented. Recognition of this phenomenon suggests a reappraisal of the importance of other potential causes of high current hFE decrease.
Keywords
Conductivity; Current density; Displays; Electrical resistance measurement; Helium; Instruments; Iron; Transient response; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1969.16829
Filename
1475871
Link To Document