• DocumentCode
    1036841
  • Title

    The effect of collector resistance upon the high current capability of n-p-ν-n transistors

  • Author

    Hahn, Larry A.

  • Author_Institution
    Texas Instruments Incorporated, Dallas, Tex.
  • Volume
    16
  • Issue
    7
  • fYear
    1969
  • fDate
    7/1/1969 12:00:00 AM
  • Firstpage
    654
  • Lastpage
    656
  • Abstract
    It is shown that the onset of conductivity modulation of the bulk collector resistance causes an abrupt decrease in hFEat high current density and consequently limits the current range in which a transistor exhibits usable gain. Data are presented which demonstrate the accurate measurement of equilibrium collector resistance from a curve-tracer display. Experimental results showing the effect of partial saturation upon transistor switching time are also presented. Recognition of this phenomenon suggests a reappraisal of the importance of other potential causes of high current hFEdecrease.
  • Keywords
    Conductivity; Current density; Displays; Electrical resistance measurement; Helium; Instruments; Iron; Transient response; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1969.16829
  • Filename
    1475871