Title :
Cross-temperature operation of Ferrite core memories
Author :
Sackter, M. ; Ogrodski, A.V.
Author_Institution :
North American Rockwell Corporation, Anaheim, Calif
fDate :
9/1/1968 12:00:00 AM
Keywords :
Ferrite core memories; Magnetic thermal effects; Application software; Assembly; Automatic testing; Drives; Ferrites; Lithium; Performance evaluation; Read-write memory; Temperature sensors; Voltage;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1968.1066224