Title :
Testing continuously plated magnetic wire
Author_Institution :
Honeywell, Inc., Waltham, Mass
fDate :
9/1/1968 12:00:00 AM
Keywords :
Automatic testing; Plated-wire memories; Anisotropic magnetoresistance; Ferrites; Magnetic anisotropy; Magnetic cores; Magnetic films; Magnetic switching; Perpendicular magnetic anisotropy; Testing; Voltage; Wire;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1968.1066249