Title :
Elimination of ambiguity in measurement of permittivity with short-circuited waveguide
Author :
Oh, K.H. ; Ong, C.K. ; Tan, B.T.G.
Author_Institution :
National University of Singapore, Department of Physics, Singapore
Abstract :
A new experimental parameter is introduced to eliminate the ambiguity in the short-circuited waveguide method for measuring permittivity. The results of our measurements using this technique for some standard materials are also presented.
Keywords :
dielectric-loaded waveguides; microwave measurement; permittivity measurement; ambiguity elimination; experimental parameter; measurement of permittivity; microwave permittivity; short-circuited waveguide method; standard materials;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19870821
