• DocumentCode
    1037570
  • Title

    The influence of substrate topography on switching time of plated wire memory elements

  • Author

    Phillips, Richard J D ; Richards, Howard D. ; Stapleton, D.C.

  • Author_Institution
    Plessey Company Ltd., Caswell, England
  • Volume
    4
  • Issue
    3
  • fYear
    1968
  • fDate
    9/1/1968 12:00:00 AM
  • Firstpage
    345
  • Lastpage
    350
  • Abstract
    Indirect measurements have been made of the switching time during the write process of selected plated wire memory elements with different substrate topographies. Results are presented for nonmagnetostrictive Ni-Fe films of thickness 4000 ± 150 Å and anisotropy field H_{k} = 2.8 \\pm 0.2 Oe in a fixed switching field geometry. Switching time is found to increase as the substrate topography becomes rougher. This is accounted for by the influence of substrate topography on easy axis dispersion and domain wall motion threshold.
  • Keywords
    Magnetic film switching; Plated-wire memories; Coils; Glass; Magnetization; Measurement techniques; Pulse measurements; Stripline; Surfaces; Time measurement; Voltage; Wire;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1968.1066264
  • Filename
    1066264
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1037570