Title :
Impedance measurement of the illuminated metal—SiO2—Si diodes
Author :
Okamoto, Hiroshi
fDate :
1/1/1970 12:00:00 AM
Abstract :
Impedance measurement of light-illuminated MIS diodes was made. It becomes clear from the results that in the inversion region conductance of the MIS structure is more sensitive to illumination than its capacitance and that negative photoconductivity appears at low frequency, which is explained by the theory of Grosvalet et al.
Keywords :
Bridge circuits; Capacitance; Capacitors; Conductivity; Diodes; Electrodes; Frequency; Impedance measurement; Lighting; Photoconductivity;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1970.16928
