DocumentCode :
1037758
Title :
Photoelectric fields in semiconductors under strong excitation
Author :
Berry, W.B. ; Yu, H.Y.
Volume :
17
Issue :
1
fYear :
1970
fDate :
1/1/1970 12:00:00 AM
Firstpage :
86
Lastpage :
87
Abstract :
Photoelectric fields induced in semiconductors with nonuniform impurity profiles cancel the built-in electric field. In the case of strong photoexcitation, the maximum open-circuit voltage approaches the internal built-in potential difference due to the impurity gradient between the ohmic contact probes on the semiconductor slice.
Keywords :
Electrons; Frequency; Insertion loss; Plasma temperature; Radiative recombination; Semiconductor impurities; Spontaneous emission; Switches; Testing; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1970.16930
Filename :
1476114
Link To Document :
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