Title :
Photoelectric fields in semiconductors under strong excitation
Author :
Berry, W.B. ; Yu, H.Y.
fDate :
1/1/1970 12:00:00 AM
Abstract :
Photoelectric fields induced in semiconductors with nonuniform impurity profiles cancel the built-in electric field. In the case of strong photoexcitation, the maximum open-circuit voltage approaches the internal built-in potential difference due to the impurity gradient between the ohmic contact probes on the semiconductor slice.
Keywords :
Electrons; Frequency; Insertion loss; Plasma temperature; Radiative recombination; Semiconductor impurities; Spontaneous emission; Switches; Testing; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1970.16930