• DocumentCode
    103805
  • Title

    Optical Properties of Sputtered SnS Thin Films for Photovoltaic Absorbers

  • Author

    Banai, Rona E. ; Lee, Hongseok ; Motyka, M.A. ; Chandrasekharan, R. ; Podraza, Nikolas J. ; Brownson, Jeffrey R. S. ; Hom, Mark W.

  • Author_Institution
    Pennsylvania State Univ., University Park, PA, USA
  • Volume
    3
  • Issue
    3
  • fYear
    2013
  • fDate
    Jul-13
  • Firstpage
    1084
  • Lastpage
    1089
  • Abstract
    Tin monusulfide (SnS) is an absorber with promising optoelectronic properties and low environmental constraints of interest for high-efficiency solar cells. The optical properties of SnS thin films are investigated to assess their compatibility with the solar spectrum. SnS thin films were RF magnetron sputter-deposited at target powers of 105-155 W and total pressures of 5 to 60 mtorr in argon at room temperature. X-ray diffraction patterns confirmed a dominant tin monosulfide herzenbergite phase. The absorption coefficient was determined by spectroscopic ellipsometry and unpolarized spectrophotometry measurements. Both methods show that the films have absorption coefficients above the band gap in the range of 105 -106 cm-1. The direct gap, indirect gap, and forbidden direct gap for the films were found to be in the range of 1.2-1.6 eV, indicating a strong match with the solar irradiance spectrum.
  • Keywords
    IV-VI semiconductors; X-ray diffraction; absorption coefficients; energy gap; photovoltaic cells; semiconductor growth; semiconductor thin films; solar cells; sputter deposition; tin compounds; RF magnetron sputter-deposition; SnS; X-ray diffraction patterns; absorption coefficient; absorption coefficients; band gap; environmental constraints; forbidden direct gap; high-efficiency cell solar; monosulfide herzenbergite phase; optical properties; optoelectronic properties; photovoltaic absorbers; power 105 W to 155 W; solar irradiance spectrum; solar spectrum; spectroscopic ellipsometry; temperature 293 K to 298 K; tin monusulfide thin film sputtering; unpolarized spectrophotometry measurements; Absorption; Educational institutions; Photonic band gap; Photovoltaic systems; Substrates; Absorption; SnS; ellipsometry; semiconductor materials; sputtering; thin films; tin compounds;
  • fLanguage
    English
  • Journal_Title
    Photovoltaics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    2156-3381
  • Type

    jour

  • DOI
    10.1109/JPHOTOV.2013.2251758
  • Filename
    6484868