DocumentCode
1038279
Title
1 THz-bandwidth proper for high-speed devices and integrated circuits
Author
Valdmanis, J.A.
Author_Institution
AT&T Bell Laboratories, Murray Hill, USA
Volume
23
Issue
24
fYear
1987
Firstpage
1308
Lastpage
1310
Abstract
We describe an external electro-optic technique for characterising high-speed electrical signals in two-dimensional electrode structures of devices and integrated circuits fabricated on any substrate material. A temporal resolution of less than 300 fs, corresponding to a bandwidth in excess of 1 THz has been achieved.
Keywords
digital integrated circuits; electro-optical effects; integrated circuit testing; probes; semiconductor device testing; 1 THz; 300 fs; digital IC testing; external electro-optic technique; high-speed devices; high-speed electrical signals; integrated circuits; prober; temporal resolution; two-dimensional electrode structures;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19870905
Filename
4259146
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