DocumentCode :
1038310
Title :
Service-affecting optoelectronic failures in FITL systems: downtime, repair actions, and maintenance expenses
Author :
De La Iglesia, R. Diaz
Author_Institution :
Telefonica Investigacion y Desarrollo, Madrid, Spain
Volume :
12
Issue :
2
fYear :
1994
fDate :
2/1/1994 12:00:00 AM
Firstpage :
361
Lastpage :
366
Abstract :
This paper provides a quantitative examination of lifecycle cost versus operating environment for fiber-in-the-loop (FITL) systems. It focuses on reactive maintenance due to service-affecting failures of optoelectronic elements. The scope is limited to passive point-to-multipoint star local networks, engineered to deliver narrowband telecommunication POT´s services, with hybrid fiber/copper architectures (i.e., the customer´s terminal equipment (TE) is connected with symmetrical copper pairs to the optical network unit or ONU of the FITL system). The influence of service-affecting failure rates, times to repair, and the various temperature environments faced by the optoelectronic equipment is evaluated in terms of: (i) service downtime; and (ii) the number of repair actions and maintenance expenses due to service affecting failures on the optoelectronics-related elements. The author estimates some $60 expenses, per line during a 20 year lifecycle, if the ONU is in a partly controlled temperature environment, and some $170 in an uncontrolled temperature environment. A downtime, per line per year, lower that 60 minutes can be achieved in both types of environment. Placing the ONU in a partly controlled environment, however, enables a 100% increase in the times to repair or, alternatively, some 90% decrease in the downtime
Keywords :
life testing; maintenance engineering; optical communication equipment; optical links; optoelectronic devices; reliability; subscriber loops; telecommunication network management; telecommunication services; FITL systems; OA&M; ONU; controlled temperature environment; customer terminal equipment; fiber-in-the-loop systems; hybrid fiber/copper architectures; lifecycle cost; maintenance expenses; narrowband telecommunication services; optical network unit; optoelectronic equipment; optoelectronic failures; passive point-to-multipoint networks; reactive maintenance; repair actions; service downtime; service-affecting failure rates; star local networks; symmetrical copper pairs; times to repair; uncontrolled temperature environment; Copper; Costs; Life estimation; Narrowband; Optical fiber devices; Optical fiber networks; Optical fiber subscriber loops; Optical network units; Tellurium; Temperature;
fLanguage :
English
Journal_Title :
Selected Areas in Communications, IEEE Journal on
Publisher :
ieee
ISSN :
0733-8716
Type :
jour
DOI :
10.1109/49.272887
Filename :
272887
Link To Document :
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