DocumentCode
1038572
Title
Correction terms for contacts to diffused resistors
Author
D´Andrea, G. ; Murrmann, H.
Volume
17
Issue
6
fYear
1970
fDate
6/1/1970 12:00:00 AM
Firstpage
484
Lastpage
485
Abstract
Correction terms obtained from measurements on typical planar resistors are given and compared to values expected from two different mechanisms: inhomogeneous current flow around the contact or contact resistance between metal and diffusion layer. Good agreement between contact resistance model and experiment is shown.
Keywords
Capacitance; Contact resistance; Diodes; Electric resistance; Electrical resistance measurement; Geometry; Oscillators; Radio frequency; Resistors; Thermal resistance;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1970.17016
Filename
1476200
Link To Document