DocumentCode :
1038602
Title :
The single-chip Fastbus slave interface
Author :
Nelson, R.O. ; Machen, D.R. ; Downing, R.W.
Author_Institution :
Sci. Syst. Int. Ltd., Los Alamos, NM, USA
Volume :
37
Issue :
2
fYear :
1990
fDate :
4/1/1990 12:00:00 AM
Firstpage :
310
Lastpage :
314
Abstract :
A single-chip implementation of the general-purpose Fastbus slave interface (FSI) has been developed in ECL (emitter-coupled logic) gate-array technology. The FSI occupies only 1.6% of the available circuit board space while providing a complete 32-b interface to the Fastbus. For slaves with 15-ns response timing, the maximum data rate expected with the single-chip interface is 25 MHz for all types of data cycles. All mandatory slave-interface requirements of IEEE 960 are supported, in addition to several nonmandatory requirements and the optional, extended MS code features. Geographic, logical, and broadcast addressing are implemented using on-chip registers. An optional multiple-module addressing technique is included that allows participating modules residing on a common crate or cable segment to respond as if individually addressed in sequence. The user interface provided by the FSI allows control of slave status-response and connection timing for both address and data cycles. The BIT1 ECL array technology used for the FSI allows direct connections to the Fastbus, eliminating the need for external driver/receiver buffers
Keywords :
physics computing; BIT1 ECL array technology; FSI; MS code features; broadcast addressing; cable segment; complete 32-b interface; connection timing; data cycles; emitter-coupled logic gate-array; external driver/receiver buffers; geographic addressing; logical addressing; on-chip registers; optional multiple-module addressing; response timing; single-chip Fastbus slave interface; slave status-response; Broadcasting; Connectors; Fastbus; Hardware; Packaging; Pins; Process design; Registers; Space technology; Testing;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.106636
Filename :
106636
Link To Document :
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