DocumentCode :
1039041
Title :
An ion milling pattern transfer technique for fabrication of three-dimensional micromechanical structures
Author :
Dizon, Roberto ; Han, Hongtao ; Russell, Armistead G. ; Reed, Michael L.
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
Volume :
2
Issue :
4
fYear :
1993
fDate :
12/1/1993 12:00:00 AM
Firstpage :
151
Lastpage :
159
Abstract :
We describe a useful method of transferring mask patterns over large distances using ion milling. This technique exploits the anisotropy of a collimated ion beam to etch the projection of a stencil mask pattern into a thin film. This method avoids the difficulties associated with photoresist processing on highly nonplanar substrates, and thus provides an alternative process avenue for the development of three-dimensional microstructures. We demonstrate this technique, in a process including wet anisotropic silicon etching, by fabricating arrays of high aspect ratio barbs which are intended for use in tissue fasteners in biomedical applications
Keywords :
ion beam applications; masks; micromechanical devices; semiconductor technology; silicon; sputter etching; Si; biomedical applications; collimated ion beam; fabrication; high aspect ratio barbs; ion milling pattern transfer; mask pattern transfer; nonplanar substrates; stencil mask pattern; thin film; three-dimensional micromechanical structures; tissue fasteners; wet anisotropic Si etching; Anisotropic magnetoresistance; Collimators; Etching; Fabrication; Ion beams; Microstructure; Milling; Resists; Substrates; Transistors;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/84.273091
Filename :
273091
Link To Document :
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