Title :
A method for continuously measuring the pinch-off voltage shift of FET structures
fDate :
10/1/1970 12:00:00 AM
Abstract :
A method is described for continuously measuring the pinch-off voltage VgTof FET structures as a function of time. This is of particular importance for the study of device instabilities.
Keywords :
Circuits; Dielectrics; Diodes; Electrons; FETs; Gunn devices; Microwave frequencies; Surface impedance; Time measurement; Voltage measurement;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1970.17101
