DocumentCode
1039598
Title
Jitter Characteristic in Charge Recovery Resonant Clock Distribution
Author
Mesgarzadeh, Behzad ; Hansson, Martin ; Alvandpour, Student Atila
Author_Institution
Linkoping Univ., Linkoping
Volume
42
Issue
7
fYear
2007
fDate
7/1/2007 12:00:00 AM
Firstpage
1618
Lastpage
1625
Abstract
This paper is focused on analysis and suppression of clock jitter in charge recovery resonant clock distribution networks. In the presented analysis, by considering the data-dependent nature of the generated jitter, the reason for the undesired jitter-peaking phenomenon is investigated. The analysis has been verified by measurements on a test chip fabricated in 0.13-mum standard CMOS process. The chip includes a fully integrated 1.5-GHz LC clock resonator with a passive (bufferless) clock distribution network, which directly drives the clocked devices in pipelined data path circuits. Furthermore, a jitter suppression technique based on injection locking is presented. Measurement results show about 50% peak-to-peak clock jitter reduction from 28.4 ps down to 14.5 ps after injection locking.
Keywords
CMOS digital integrated circuits; clocks; jitter; resonators; CMOS process; LC clock resonator; charge recovery; clock jitter suppression; frequency 1.5 GHz; injection locking; jitter characteristic; resonant clock distribution; size 0.13 mum; time 14.5 ps; time 28.4 ps; CMOS process; Circuit testing; Clocks; Drives; Injection-locked oscillators; Integrated circuit measurements; Jitter; Measurement standards; Resonance; Semiconductor device measurement; Charge recovery resonant clocking; clock distribution network; jitter peaking; jitter suppression; low power;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.2007.896691
Filename
4261012
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