• DocumentCode
    1039647
  • Title

    A 20 dBm Fully-Integrated 60 GHz SiGe Power Amplifier With Automatic Level Control

  • Author

    Pfeiffer, Ullrich R. ; Goren, David

  • Author_Institution
    IBM Thomas J. Watson Res. Center, Yorktown Heights
  • Volume
    42
  • Issue
    7
  • fYear
    2007
  • fDate
    7/1/2007 12:00:00 AM
  • Firstpage
    1455
  • Lastpage
    1463
  • Abstract
    A + 20 dBm power amplifier (PA) for applications in the 60 GHz industrial scientific medical (ISM) band is presented. The PA is fabricated in a 0.13-mum SiGe BiCMOS process technology and features a fully-integrated on-chip RMS power detector for automatic level control (ALC), built-in self test and voltage standing wave ratio (VSWR) protection. The single-stage push-pull amplifier uses center-tapped microstrips for a highly efficient and compact layout with a core area of 0.075 mm2. The PA can deliver up to 20 dBm, which to date, is the highest reported output power at mm-wave frequencies in silicon without the need for power combining. At 60 GHz it achieves a peak power gain of 18 dB, a 1-dB compression (P1dB) of 13.1 dBm, and a peak power-added efficiency (PAE) of 12.7%. The amplifier is programmable through a three-wire serial digital interface enabeling an adaptive bias control from a 4-V supply.
  • Keywords
    BiCMOS integrated circuits; Ge-Si alloys; MIMIC; closed loop systems; differential amplifiers; microstrip components; millimetre wave power amplifiers; power control; BiCMOS process technology; ISM band; SiGe; adaptive bias control; automatic level control; built-in self test; center-tapped microstrips; closed-loop power control; frequency 60 GHz; fully-integrated on-chip RMS power detector; fully-integrated power amplifier; gain 18 dB; industrial scientific medical band; mm-wave frequencies; peak power gain; peak power-added efficiency; single-stage push-pull amplifier; size 0.13 mum; three-wire serial digital interface; voltage 4 V; voltage standing wave ratio protection; Automatic logic units; Automatic testing; BiCMOS integrated circuits; Detectors; Germanium silicon alloys; Level control; Microstrip; Power amplifiers; Protection; Silicon germanium; 60 GHz; Automatic level control; RMS power detector; bipolar transistor; built- in self-test; closed-loop power control; mm-wave; power amplifier; power detector; silicon germanium;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2007.899116
  • Filename
    4261017