Title :
Magnetization in Ni and Ni-Fe thin films
Author :
Freedman, James F. ; Mayadas, A.F. ; Klokholm, E.
Author_Institution :
Thomas J. Watson Research Center, IBM Corporation, Yorktown Heights, N. Y.
fDate :
9/1/1969 12:00:00 AM
Abstract :
Nickel films have been deposited in conventional high vacuum, ultra-high vacuum, and in controlled contaminant, ultra-high vacuum environments. High field saturation magnetization Msmeasurements on the films made in high vacuum and an oxygen-contaminated ultra-high vacuum system show that they posses low values of Msfor film thicknesses of 1000 Å. The normal moments observed for ultra-high vacuum deposited films lead to the conclusion that the low Msvalues are associated with the oxygen and are caused by a true loss of effective magnetization rather than coupled superparamagnetism or a ripple blocking field. Supplementary torque and ferromagnetic resonance studies on the Ni and two different Ni-Fe compositions also show that the grain boundary perpendicular anisotropy models are not particularly relevant for films made under such nominal technical vacuum conditions.
Keywords :
Iron-nickel films; Nickel-iron films; Couplings; Magnetic field measurement; Magnetic losses; Nickel; Pollution measurement; Saturation magnetization; Thickness measurement; Torque; Transistors; Vacuum systems;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1969.1066466