• DocumentCode
    1039697
  • Title

    Magnetization in Ni and Ni-Fe thin films

  • Author

    Freedman, James F. ; Mayadas, A.F. ; Klokholm, E.

  • Author_Institution
    Thomas J. Watson Research Center, IBM Corporation, Yorktown Heights, N. Y.
  • Volume
    5
  • Issue
    3
  • fYear
    1969
  • fDate
    9/1/1969 12:00:00 AM
  • Firstpage
    170
  • Lastpage
    173
  • Abstract
    Nickel films have been deposited in conventional high vacuum, ultra-high vacuum, and in controlled contaminant, ultra-high vacuum environments. High field saturation magnetization Msmeasurements on the films made in high vacuum and an oxygen-contaminated ultra-high vacuum system show that they posses low values of Msfor film thicknesses of 1000 Å. The normal moments observed for ultra-high vacuum deposited films lead to the conclusion that the low Msvalues are associated with the oxygen and are caused by a true loss of effective magnetization rather than coupled superparamagnetism or a ripple blocking field. Supplementary torque and ferromagnetic resonance studies on the Ni and two different Ni-Fe compositions also show that the grain boundary perpendicular anisotropy models are not particularly relevant for films made under such nominal technical vacuum conditions.
  • Keywords
    Iron-nickel films; Nickel-iron films; Couplings; Magnetic field measurement; Magnetic losses; Nickel; Pollution measurement; Saturation magnetization; Thickness measurement; Torque; Transistors; Vacuum systems;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1969.1066466
  • Filename
    1066466