DocumentCode
1039697
Title
Magnetization in Ni and Ni-Fe thin films
Author
Freedman, James F. ; Mayadas, A.F. ; Klokholm, E.
Author_Institution
Thomas J. Watson Research Center, IBM Corporation, Yorktown Heights, N. Y.
Volume
5
Issue
3
fYear
1969
fDate
9/1/1969 12:00:00 AM
Firstpage
170
Lastpage
173
Abstract
Nickel films have been deposited in conventional high vacuum, ultra-high vacuum, and in controlled contaminant, ultra-high vacuum environments. High field saturation magnetization Ms measurements on the films made in high vacuum and an oxygen-contaminated ultra-high vacuum system show that they posses low values of Ms for film thicknesses of 1000 Å. The normal moments observed for ultra-high vacuum deposited films lead to the conclusion that the low Ms values are associated with the oxygen and are caused by a true loss of effective magnetization rather than coupled superparamagnetism or a ripple blocking field. Supplementary torque and ferromagnetic resonance studies on the Ni and two different Ni-Fe compositions also show that the grain boundary perpendicular anisotropy models are not particularly relevant for films made under such nominal technical vacuum conditions.
Keywords
Iron-nickel films; Nickel-iron films; Couplings; Magnetic field measurement; Magnetic losses; Nickel; Pollution measurement; Saturation magnetization; Thickness measurement; Torque; Transistors; Vacuum systems;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1969.1066466
Filename
1066466
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