DocumentCode :
1039703
Title :
A technique for measuring the dispersion characteristics in slow-wave circuits containing materials with nonreciprocal RF properties
Author :
De Santis, C.
Volume :
17
Issue :
12
fYear :
1970
fDate :
12/1/1970 12:00:00 AM
Firstpage :
1089
Lastpage :
1090
Abstract :
A traveling wave technique to measure the dispersion charateristics of slow-wave circuits is described which uses a sensitive phase measurement system and negates the requirment for shorting the circuit under test. Because of the elimination of the short and because the sensitivity of the measurement does not require strong coupling to the circuit fields, errors due to the creation of spurious modes are minimized. Comparison of wavelength measurements using this system with those of previous techniques show excellent agreement.
Keywords :
Circuit testing; Dispersion; Electrical resistance measurement; Electrons; FETs; Phase measurement; Radio frequency; Resistors; Voltage; Wavelength measurement;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1970.17133
Filename :
1476317
Link To Document :
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