DocumentCode :
1039829
Title :
Applications of X-ray diffraction topography to the study of magnetic domains
Author :
PolcarovÁ, Milena
Author_Institution :
Institute of Physics, Praha, Czechoslovakia.
Volume :
5
Issue :
3
fYear :
1969
fDate :
9/1/1969 12:00:00 AM
Firstpage :
536
Lastpage :
544
Abstract :
X-ray diffraction topographic methods, namely, Lang´s transmission topography, are briefly described. Besides different lattice defects, magnetic domains can be made visible by these methods. A number of experiments illustrating the main features of the contrast produced on domain walls are shown. The condition of visibility of 90° walls was found and interpreted on the basis of the magnetostrictive deformation of the crystal. Details of the contrast were explained using the dynamical theory of X-ray diffraction. Applications of X-ray topography to the study of magnetic domains are suggested, namely, the investigation of internal domain structures in nontransparent samples, the study of the fine structure of the walls inside the specimen, the examination of stress fields around domain walls, and the observation of domain interaction with other lattice defects.
Keywords :
Magnetic domains; X-ray diffraction topography; Focusing; Graphics; Internal stresses; Lattices; Magnetic domain walls; Magnetic domains; Magnetostriction; Surface topography; X-ray diffraction; X-ray imaging;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1969.1066479
Filename :
1066479
Link To Document :
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