SATAN: A versatile memory array tester

A storage array tester and analyzer is described which is equipped with a new type of single-shot sampling system. This sampling system takes 30 amplitude samples of the presented signal, with sample spacings down to 1 ns, which allows a thorough analysis of batch-fabricated memory element arrays. Driving of the array elements is done with one set of current generators which are via reed relay networks connected with the elements under test. Pulses with rise times down to 5 ns are propagated through the complex networks without appreciable distortion.