• DocumentCode
    1040011
  • Title

    SATAN: A versatile memory array tester

  • Author

    Van De Grijp, A. ; Holtwijk, T. ; Wijnhoven, R. M G

  • Author_Institution
    Philips Research Laboratories, Eindhoven, Netherlands
  • Volume
    5
  • Issue
    3
  • fYear
    1969
  • fDate
    9/1/1969 12:00:00 AM
  • Firstpage
    656
  • Lastpage
    661
  • Abstract
    A storage array tester and analyzer is described which is equipped with a new type of single-shot sampling system. This sampling system takes 30 amplitude samples of the presented signal, with sample spacings down to 1 ns, which allows a thorough analysis of batch-fabricated memory element arrays. Driving of the array elements is done with one set of current generators which are via reed relay networks connected with the elements under test. Pulses with rise times down to 5 ns are propagated through the complex networks without appreciable distortion.
  • Keywords
    Computer-aided testing; Magnetic memories; Distortion measurement; Fabrication; Ferrites; Information analysis; Materials testing; Production; Relays; Sampling methods; Signal analysis; System testing;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1969.1066496
  • Filename
    1066496
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1040011