Title :
Techniques for Memory Testing
Author :
Crafts, James M.
Author_Institution :
Teradyne, Inc.
Abstract :
Semiconductor memory production relies hedvily on test technology. One testing technique—real-time bit mapping—offers more advantages than any other.
Keywords :
Flash memory; Life testing; Lithography; Process design; Product design; Random access memory; Semiconductor device testing; Semiconductor memory;
DOI :
10.1109/MC.1979.1658492
