The Effects of the Microelectronics Revolution on Systems and Board Test
Author :
Foley, Eugene
Author_Institution :
Teradyne, Inc.
Volume :
12
Issue :
10
fYear :
1979
Firstpage :
32
Lastpage :
38
Abstract :
Increasing device complexity has brought increased responsibility both for test engineers and design engineers: design engineers must create testable designs; test engineers must report testability problems back to the designers.
Keywords :
Electronic equipment testing; Microelectronics; Product design; System testing; Very large scale integration;
