• DocumentCode
    1040058
  • Title

    The Effects of the Microelectronics Revolution on Systems and Board Test

  • Author

    Foley, Eugene

  • Author_Institution
    Teradyne, Inc.
  • Volume
    12
  • Issue
    10
  • fYear
    1979
  • Firstpage
    32
  • Lastpage
    38
  • Abstract
    Increasing device complexity has brought increased responsibility both for test engineers and design engineers: design engineers must create testable designs; test engineers must report testability problems back to the designers.
  • Keywords
    Electronic equipment testing; Microelectronics; Product design; System testing; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Computer
  • Publisher
    ieee
  • ISSN
    0018-9162
  • Type

    jour

  • DOI
    10.1109/MC.1979.1658494
  • Filename
    1658494
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1040058