DocumentCode :
1040092
Title :
Dependence of plated-wire memory element lifetime on operating conditions
Author :
Bernard, Edward F.
Author_Institution :
Autonetics, North American Rockwell Division, Anaheim, Calif.
Volume :
5
Issue :
3
fYear :
1969
fDate :
9/1/1969 12:00:00 AM
Firstpage :
516
Lastpage :
516
Keywords :
NDRO memories; Permalloy films; Plated-wire memories; Annealing; Creep; Current measurement; Iron; Life testing; Magnetic field measurement; Magnetic films; Stability; Temperature measurement; Wire;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1969.1066504
Filename :
1066504
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1040092
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