DocumentCode
1040092
Title
Dependence of plated-wire memory element lifetime on operating conditions
Author
Bernard, Edward F.
Author_Institution
Autonetics, North American Rockwell Division, Anaheim, Calif.
Volume
5
Issue
3
fYear
1969
fDate
9/1/1969 12:00:00 AM
Firstpage
516
Lastpage
516
Keywords
NDRO memories; Permalloy films; Plated-wire memories; Annealing; Creep; Current measurement; Iron; Life testing; Magnetic field measurement; Magnetic films; Stability; Temperature measurement; Wire;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1969.1066504
Filename
1066504
Link To Document