Title :
Mitigation of Single-Event Charge Sharing in a Commercial FPGA Architecture
Author :
Kelly, Andrew T. ; Alles, Michael L. ; Ball, D.R. ; Massengill, Lloyd W. ; Ramaswamy, Srini ; Haddad, Nadim F. ; Brown, Ronald D. ; Fleming, Patrick R. ; Chan, Erwin Hoi Wing ; Ekanayake, Virantha ; Kelly, Clinton W. ; Pelosi, Christopher ; McMorrow, Dale
Author_Institution :
BAE Syst., Manassas, VA, USA
Abstract :
The motivation for single event effects (SEE) analysis and mitigation as part of the process for adaptation of a commercial Field Programmable Gate Array (FPGA) architecture for space-qualified applications is discussed. The interdependent roles of heavy-ion and laser-induced upset evaluation coupled with computer-aided investigations of SEE mechanisms and mitigation techniques in this process are shown to enable a significant reduction in SEE sensitivity of the device, while achieving minimal impact on remanufacturing steps.
Keywords :
field programmable gate arrays; Field Programmable Gate Array architecture; SEE mechanisms; commercial FPGA architecture; computer-aided investigations; heavy-ion interdependent roles; laser-induced upset evaluation; mitigation techniques; single-event charge; space-qualified applications; Arrays; Field programmable gate arrays; MOS devices; Radiation detectors; Shift registers; System recovery; Testing; Charge sharing; RHFGPA; radiation hardening by design; single event effects;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2014.2338397
