Mitigation of Single-Event Charge Sharing in a Commercial FPGA Architecture

Author

Kelly, Andrew T. ; Alles, Michael L. ; Ball, D.R. ; Massengill, Lloyd W. ; Ramaswamy, Srini ; Haddad, Nadim F. ; Brown, Ronald D. ; Fleming, Patrick R. ; Chan, Erwin Hoi Wing ; Ekanayake, Virantha ; Kelly, Clinton W. ; Pelosi, Christopher ; McMorrow, Dale

Author_Institution

BAE Syst., Manassas, VA, USA

Volume

61

Issue

4

fYear

2014

fDate

Aug. 2014

Firstpage

1635

Lastpage

1642

Abstract

The motivation for single event effects (SEE) analysis and mitigation as part of the process for adaptation of a commercial Field Programmable Gate Array (FPGA) architecture for space-qualified applications is discussed. The interdependent roles of heavy-ion and laser-induced upset evaluation coupled with computer-aided investigations of SEE mechanisms and mitigation techniques in this process are shown to enable a significant reduction in SEE sensitivity of the device, while achieving minimal impact on remanufacturing steps.

Keywords

field programmable gate arrays; Field Programmable Gate Array architecture; SEE mechanisms; commercial FPGA architecture; computer-aided investigations; heavy-ion interdependent roles; laser-induced upset evaluation; mitigation techniques; single-event charge; space-qualified applications; Arrays; Field programmable gate arrays; MOS devices; Radiation detectors; Shift registers; System recovery; Testing; Charge sharing; RHFGPA; radiation hardening by design; single event effects;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2014.2338397

Filename

6870676