Title :
Mathematical analysis of cross-wire probe measurements
Author :
Stapper, Charles H.
Author_Institution :
IBM Corporation, Essex Junction, VT, USA
fDate :
9/1/1969 12:00:00 AM
Abstract :
The cross-wire probe can be used for measuring static magnetic properties in small regions of thin magnetic memory films. This paper gives analytical solutions for the cross-wire probe outputs. The theoretical analysis is based on the ideal rotational switching model for flat films. Results are in excellent agreement with the experimental waveforms obtained in measurements of

, and skew.
Keywords :
Magnetic films; Magnetic measurements; Coils; Detectors; Magnetic analysis; Magnetic field measurement; Magnetic films; Magnetic properties; Magnetostatics; Mathematical analysis; Probes; Receivers;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1969.1066529