• DocumentCode
    1040442
  • Title

    Magnetic field measurements in the scanning electron microscope

  • Author

    Thornley, Richard F M ; Hutchison, Jack D.

  • Author_Institution
    IBM Corporation, Boulder, Colo.
  • Volume
    5
  • Issue
    3
  • fYear
    1969
  • fDate
    9/1/1969 12:00:00 AM
  • Firstpage
    271
  • Lastpage
    275
  • Abstract
    Local magnetic fields emanating from recording tapes and heads have been measured by observing their effect on the beam of a scanning electron microscope. Theoretical calculations indicate that tape fields recorded at densities up to 25 000 flux reversals/inch should be observable. A variation on the basic technique, using the astigmatic aberration of the electron beam, can be used to measure field gradients directly.
  • Keywords
    Magnetic field measurement; Magnetic recording heads; Magnetic tape materials; Scanning electron microscopy; Electron beams; Electron optics; Geometry; Magnetic field measurement; Magnetic fields; Magnetic force microscopy; Magnetic heads; Magnetic recording; Scanning electron microscopy; Shape measurement;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1969.1066539
  • Filename
    1066539