Title :
Guest Editors´ Introduction: Advances in VLSI Testing at MultiGbps Rates
Author :
Ivanov, A. ; Lombardi, F. ; Metra, C.
Author_Institution :
University of British Columbia
Abstract :
Presents the guest editorial for this issue of the publication.
Keywords :
Built-in self-test; Costs; Digital systems; Electronics industry; Environmental economics; Jitter; Manufacturing; Product development; System testing; Very large scale integration;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2004.31
