DocumentCode :
1040705
Title :
Critical race-free low-power nand match line content addressable memory tagged cache memory
Author :
Chaudhary, V. ; Chen, T.-H. ; Sheerin, F. ; Clark, L.T.
Author_Institution :
Arizona State Univ., Tempe
Volume :
2
Issue :
1
fYear :
2008
fDate :
1/1/2008 12:00:00 AM
Firstpage :
40
Lastpage :
44
Abstract :
A low-power content addressable memory (CAM)-tagged microprocessor cache using dynamic hierarchical NAND match lines is presented, emphasising the timing impact on overall cache design. Low-capacitive clock loading and lower NAND CAM match line activity factor provide a total cache tag power dissipation savings of up to 64% over a conventional design with NOR match lines. The circuit design, operation and physical layout are described. Results measured on a 0.13-mum low standby power foundry process demonstrate 3.29 fJ/bit/search CAM tag energy at VDD = 0.9 V and nearly 1 GHz operating frequency at VDD = 1.75 V. The NAND match lines allow a completely critical race-free cache memory design, which improves robustness at high-scaled process technology nodes, while maintaining fast single-cycle access times.
Keywords :
cache storage; content-addressable storage; integrated circuit design; logic gates; low-power electronics; microprocessor chips; cache design; circuit design; critical race-free low-power NAND match line; dynamic hierarchical NAND match lines; low-capacitive clock loading; low-power content addressable memory; power dissipation savings; tagged cache memory; tagged microprocessor cache; voltage 0.9 V; voltage 1.75 V;
fLanguage :
English
Journal_Title :
Computers & Digital Techniques, IET
Publisher :
iet
ISSN :
1751-8601
Type :
jour
DOI :
10.1049/iet-cdt:20070040
Filename :
4435124
Link To Document :
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